Thursday, May 6, 2010

SSD Test Solution Seminar Post Review

The solid state technology remains a captivating topic in the IT industry, despite the effect of the fluctuation on the costs of NAND Flash. On April 27, representatives came from PC manufacturers, NAND Flash makers, IC design houses and Module houses have gathered for Allion’s first major event of this year, the “SSD Test Solution Seminar” which was held at Allion’s Taipei facility in Taiwan.

For nearly 3 hours of event, over 150 attendees have witnessed, as Allion delivered a series SSD test concept focusing on the SSD Endurance, Data Retention, Signal Integrity through connecting interfaces, OS Optimization, Industry Standards and the emerging TRIM Command.

A live demonstration featuring SSD Power Cycle and Stress Test were also conducted by Allion test engineers to the audience. And in order for all the participants to experience if they have implemented TRIM Command properly in their SSDs, Allion offers free TRIM Command Testing Sessions that each company will be able to schedule a free test slot privately with the Allion’s service representative. To explore more on Allion’s presentation, please visit
http://www.allion.com/training.html